The Binning operation is used to reduce the size of the diffraction patterns. Although binning is typically performed during the acquisition stage to reduce the integration time, this operation allows the user to further decrease the size of the diffraction pattern if needed. Calculations intensive tests like the Hough transform are faster on smaller patterns. This operation can also be used for testing and debugging algorithms.


The user needs to specify the reduction factor of the diffraction patterns. The factor, of binning size, must be an even number greater than 2.


Original pattern (336x256)


Binned pattern by a factor of 4 (84x64)