Pattern qualityΒΆ

Quality metric that is defined in the Oxford’s EBSD explained brochure. [1] It consists in the average of the 3 most intense Hough peak‘s divided by the standard deviation of the HoughMap.

By ordering the Hough peaks in descending order,

Q = \frac{1}{3\sigma_h} \sum\limits_{i=1}^3{I_i}

where \sigma_h is the standard deviation of the HoughMap and I_i is the intensity of peak i.

  1. {Oxford Instruments plc.}. (2004). Electron back-scattered diffraction explained. : {Oxford Instruments plc.} .